April 2010 |
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Technology Forum |
Optics/Lasers
Lasers and optics continue to comprise a thriving and emerging market in the field of spectroscopy, with new breakthroughs occurring at a rapid pace. Here to discuss the latest developments in these areas are Alexander Bolshakov, Applied Spectra; Phil Taday, TeraView; and Rob Morris, Ocean Optics, Inc.
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Webcast |
Free Webcast: Analysis of Metals in Semiconductor and Industrial Gases with ICP-MS
Thursday, April 22, 2010 from 11:00 AM to 12:00 PM ET
Three basic methodologies involved in dealing with the analysis of gases by ICP-MS will be discussed.
Sponsored by: Thermo Fisher Scientific
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Featured Articles |
How Optical Advances Helped Deliver the Promise of Miniature Spectrometers
Performance gaps in the industry's earliest miniature spectrometers today have been mitigated by the ongoing improvement of gratings, coatings, mirrors, and other spectrometer bench optical components. MORE » |
Spectroscopy Bounces Back
The spectroscopy market and its major segments, atomic and molecular spectroscopy and mass spectrometry, is analyzed and forecasted for 2010. MORE » |
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Webcast |
AFM-Raman: Fact, Fiction, Results and the Future
LIVE WEBCAST: Wednesday, May 26, 2010 11:00 AM ET
This webcast will review the best spatial resolution obtainable with standard Raman microscopy and then discuss when and how combining Raman with AFM will be beneficial. Different AFM/Raman techniques will be described, including tip enhanced Raman spectroscopy (TERS). » REGISTER FREE at
www.spectroscopyonline.com/fact
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Featured Product |
AvaSpec FAST Series
Now Avantes has spectrometers for high speed applications such as pulsed laser applications in the UV/VIS and NIR (200-1100 nm).
This instrument series is designed to optimize the speed of the spectral acquisition or integration time.
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Retsch’s New CryoMill
Retsch's CryoMill is suited for milling small sample volumes in the laboratory. With its integrated, automatic liquid nitrogen cooling system, the CryoMill eliminates the need to manually cool samples.
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Si-PIN detector
The XPIN Si-PIN detector from MOXTEK is intended for use in benchtop and handheld energy dispersive X-ray fluorescence instrumentation. The detector reportedly is optimized to provide maximized resolution, count rate, energy absorption, and peak-to-background for industrial and scientific applications. According to the company, the detector has a 625-µm-thick Si-PIN diode, an ultralow-noise JFET, a multilayer collimator, a preamplifier, and a two-stage thermoelectric cooler. The detector’s 8-µm windows are coated to resist corrosion and harsh environments. The detector is available with a 6-mm2 or 13-mm2 active area.
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ICP-MS system
The PerkinElmer Sciex NexION 300 ICP-MS system provides standard, collision, and reaction modes of operation. In standard mode, the system’s cell reportedly is turned off for use with elements that require no interference correction. In collision mode, the system can be used for semiquantitative analyses, environmental sample monitoring, and the testing of unknown samples. According to the company, the instrument’s reaction mode removes interferences without loss of analyte sensitivity and features a scanning quadrupole that allows only the element of interest to pass to the analyzing quadrupole.
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Question of the Month |
How often do you use laser-based techniques in your daily work?
A) Daily
B) Often
C) Occasionally
D) Rarely
Click Here to Vote |
Last Month's Results |
Will Pittcon 2011 in Atlanta, Georgia fare better or worse than this year’s show in Orlando, Florida?
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50% |
Better |
36% |
About the same |
14% |
Worse |
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Feedback |
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