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June 2012 |
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Combined Elemental Analysis and Material Identification PANalytical Epsilon 3 XRF systems are well suited for rapid positive material identification (PMI) of chemical mixtures, minerals, and other products, as well as simultaneous elemental analysis from fluorine to uranium. |
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Confocal Raman and AFM Imaging of Diamond Films, Carbon Nanotubes, and Graphene WITec GmbH Raman imaging and AFM provide invaluable information regarding chemical and structural properties for the characterization of nano-carbon materials. This article highlights advantages of these techniques when applied to diamond films, carbon nanotubes, and graphene. |
| A New Approach to Sample Preparation Free Micro ATR FT-IR Chemical Imaging of Polymer Laminates Dr. Mustafa Kansiz, Agilent Technologies This note describes a new ultra-low pressure micro ATR FT-IR chemical imaging method that removes the need for any structural support when analyzing polymers. Adhesive layers as thin as a few microns can be clearly observed in 50-µm thick polymer laminates, without sample preparation. |
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| Determination of Percent Polyethylene in Polyethylene/Polypropylene Blends Using Cast Film FT-IR Techniques Frank Higgins, Agilent Technologies This note demonstrates a novel method for rapidly determining the polyethylene to polypropylene ratio in polymer blends using the Cary 630 FT-IR spectrometer. |
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| Plasma Monitoring with Miniature High-Resolution Spectroscopy Yvette Mattley, PhD, Ocean Optics A modular, high resolution miniature CCD-array spectrometer is a versatile tool for monitoring changes in plasma emission following the introduction of different gases and nanoparticles to a plasma chamber. |
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| Protein Stability by Chemical Denaturation Professor Sandro Keller, Sebastian Fiedler, and Dr. Lindsay Cole, Applied Photophysics Ltd. Automated circular dichroism (ACD) was used to determine the thermodynamic stability of a protein by chemical denaturation. |
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| Analysis of Contaminations on Plastic Using FT-IR Microscope Dr. Matthias Boese, Bruker Optics Contaminations of polymer products are often microscopically small and not easy to analyze. Without knowing the chemical composition of the defect, the determination of its origin is often difficult. FT-IR microscopy is an attractive tool for the analysis of contaminations, since this technique is capable of identifying not only organic but also inorganic components. |
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