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Determination of 22 Elements in Copper (Cu)
Dr. Rainer Nehm, HORIBA Scientific
Inductively-coupled plasma-optical emission spectrometry (ICP-OES) easily determines minor and major elements concentrations in copper analysis. This application note describes the development of a method to determine elements in a copper matrix.
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EDXRF Analysis of Silicone Coating on Paper and Plastic
Applied Rigaku Technologies
Paper and plastic are coated with a thin layer of silicone during the manufacture of labels, tape, or other adhesives, or as a barrier coating against air in the packaging of food, medical products, and other materials. EDXRF analysis with the Rigaku NEX QC is shown to be an excellent tool for measuring silicone coating to ensure the proper physical properties of the product are maintained.
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Miniature 60 kV, 1000 µA, 12 W X-ray Source
Sterling Cornaby, Moxtek
The new 12 W source from Moxtek is meant for use in small beach top and portable XRF systems where small size components are valued. Its features are critical for more precise and faster XRF analysis of heavy and light elements at low concentrations.
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Analysis of Gemstones and Diamonds in Jewelry using FTIR Microscopy
Thomas J. Tague Jr., PhD, Bruker Optics, Inc.
The LUMOS FTIR microscope is suitable for the examination, identification, and classification of mounted diamonds. Small stones that are in close proximity to others can be used to readily determine whether the stone is natural or synthetic and whether it has undergone treatment, thereby assessing its true value.
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Using the Full Spectrum for Raman: from UV to NIR
Dr. E. Illy, Professor W. R. Browne, and Dr. A. Draksharapu, Cobolt
With the current availability of high performance DPSS lasers offering a broad range of wavelengths from the UV to the NIR, the applications for Raman spectroscopy are only just beginning to be fully explored.
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Analysis of Artificially Weather PET and a Separate PET Hydrolysis Evaluation Using the 4300 Handheld FT-IR
Frank Higgins, Pik Leung Tang, and Alan Rein, Agilent Technologies
Elucidating chemical changes in carbon fiber composites prior to physical degradation has been effectively demonstrated using handheld FT-IR analyzers. This application note shows that a handheld infrared spectrometer is equally effective at measuring early onset chemical changes in environmentally stressed PET polymer, which precede cracking and other physical degradation processes. This is an important issue in applications where polymers (as well as other materials such as paints and coatings) are exposed to environmental conditions varying from climatic conditions that depend on their geographic locale to complete submersion, as in the case of marine paints. The commercial availability of handheld FT-IR spectrometers affords the capability of nondestructively measuring areas of large polymer sheets, as well as other coatings.
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Rapid Crystal Orientation
Owen Vajk and Don Bilderback, Multiwire Laboratories
The MWL120 real-time Laue camera combines single-photon detector sensitivity, rapid signal processing technology, and innovative software control to provide the fastest, easiest way to orient single crystals.
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Narrowband Laser Characterization
Ocean Optics
Miniature spectrometers can be configured to characterize high-resolution laser output in the UV-vis and NIR spectral regions, either as part of an internal laser feedback loop or externally.
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Nanoscale IR spectroscopy: Analyzing Polymer Composites
Curt Marcott, PhD and Mike Lo, PhD, Anasys Instruments
Polymer composites are a very important class of materials where new components such as fibers, nanotubes, clays and so on, are added to polymer matrices to enhance properties and add value to the product. Understanding the interphase of the composite and polymer matrix is important to optimize the processing conditions and to understand degradation or other failure mechanisms. AFM-IR is a new technique wherein an atomic force microscope (AFM) probe tip is used as an IR absorbance detector to provide nanoscale IR spectroscopy. This article discusses the application of AFM-IR to provide nanoscale chemical and physical property information about a carbon fiber/epoxy composite.
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