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Application of the Agilent 7900 ICP-MS with Method Automation Function for the Routine Determination of Trace Metallic Components in Food CRMs
Kazuhiro Sakai, Junichi Takahashi, and Ed McCurdy, Agilent Technologies
This application note describes the use of the Agilent 7900 ICP-MS, running a method developed using the method automation software function in ICP-MS MassHunter Software, for trace elemental analysis of fish certified reference materials (CRMs). The Method Wizard selects the most appropriate operating conditions (plasma mode and tuning conditions), analyte isotopes, integration times, cell gas modes, and internal standards based on the current instrument configuration and the composition of the user’s own reference sample, which is measured as part of the method setup.
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Miniature 60 kV, 1000 µA, 12 W X-ray Source
Sterling Cornaby, Moxtek
The new 12 W source from Moxtek is meant for use in small bench top and portable XRF systems where small size components are valued. It’s features are critical for more precise and faster XRF analysis of heavy and light elements at low concentrations.
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Characterizing Electrical Contacts Using the Chemreveal™ LIBS Desktop Elemental Analyzer
TSI Inc.
Connectors and tracks on printed circuit boards supply power and pass signals between electronic components soldered to the board. While primarily made of copper, alloying agents and overcoating are frequently used to improve the manufacturability and durability of traces and contact points. This note reports on analysis metals contacts on an intact circuit board using LIBS. In a single analysis, we obtain information on noble and transition metals as well as beryllium in copper.
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Implementation of the New USP Chapters
Lee Davidowski and Ewa Pruszkowski, PerkinElmer
Benefits of the NexION 300X/350X ICP-MS coupled with the prepFAST In-line Auto-dilution/calibration system for the implementation of the new USP chapters on elemental impurities.
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