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Photo Credit: Getty Images/imagewerks |
Tackling Unresolved Problems in ICP-MS
Inductively coupled plasma–mass spectrometry (ICP-MS) is a powerful analytical technique. But like any other analytical techniques, there are challenges involved. We recently asked ICP-MS experts what unresolved problems exist—especially with samples in complex matrices—and how ICP-MS methods or technologies can be developed to attack them. |
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Using X-ray Techniques to Monitor Air Pollution
Air quality is a global concern, but even more so for urban areas and poor countries. The pollution in the air goes directly into our lungs, which makes monitoring the particulates and various levels of pollution a major concern. Johan Boman of the Department of Chemistry & Molecular Biology at University of Gothenburg has been studying the air quality in several different regions using energy dispersive X-ray fluorescence (EDXRF) and total reflection X-ray fluorescence (TXRF). Here, he discusses the challenges faced in this research and plans for future studies. |
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What's New in the Proposed USP <1058> Update?
Changes have been proposed to the United States Pharmacopeia Chapter <1058> on analytical instrument qualification. Here is what you need to know about the impact of those changes on the qualification of analytical instruments and laboratory computerized systems. |
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Networking and Educational Opportunities at Upcoming Eastern Analytical Symposium
The 2015 Eastern Analytical Symposium and Exposition (EAS) takes place November 16–18, in Somerset, New Jersey. This year, attendees can expect plenty of educational and networking opportunities for analytical scientists. In advance of the event, Spectroscopy spoke to EAS President Oscar Liu about some of the most interesting and exciting activities scheduled for the event. |
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| Join us for Free Webinar: Ethos UP for Environmental Labs |
Amptek Experimenter's XRF Kit |
Today’s environmental labs need to produce better trace metals data, faster. Sample preparation remains a critical component of that trace metals analysis process and while HotBlocks® are cost-effective, they lack the ability to increase turnaround time and digest challenging matrices. In order to meet their customers’ demands, more environmental labs are turning to microwave technology as a supplementary sample preparation tool.
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Quickly begin doing XRF elemental analysis. Kit includes: X-123 Complete Spectrometer with FAST SDD®, SDD or Si-PIN detector; Mini-X X-Ray Tube; XRF-FP QA Software; sample enclosure; and test sample.
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| Orbis Micro X-ray Fluorescence Analyzer |
Compact CCD Broadband Spectrometer |
The Orbis Micro-XRF analyzer offers non-destructive elemental analysis capabilities with minimal sample preparation. It provides the most advanced features for qualitative and quantitative analysis for a variety of applications with high special resolution and optical geometry from trace, bulk, to multi-layer coating application.
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The HRS-BD1 compact broadband spectrometer features a high-resolution 100mm Czerny-Turner optical platform coupled with a 3648-element CCD array, a working range of 300-1050nm and excellent stability over time and temperature.
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| MicromATR Vision™ |
The Unscrambler® X |
See what you sample! FT-IR Diamond ATR Sampling Fast and Easy with fully Integrated Sample viewing and Image capture with exclusive E-Spot Software. Many ATR crystal choices.  Learn more |
The Unscrambler® X has set the standard in multivariate analysis (MVA) and design of experiments software for over 25 years. It is the preferred tool for thousands of data analysts, researchers and engineers around the world.
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| Vision in Life Sciences Conference 2015 |
MiniFlex - Benchtop X-ray diffraction (XRD) instrument |
At the Vision in Life Sciences Conference, you will discover more about sensors, microscopes, lighting, filters and software used to process data. Industry experts will discuss these technologies which will allow you to question your current system limitations.
 Register here |
Ideally-suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600 W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution.
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