Spectroscopy App Note:
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March 2015 

Featured Application Note:

The Moxtek ICE Cube™ Polarizing Beamsplitter
A broadband polarizing beamsplitter (PBS) cube was developed using embedded Moxtek® Nanowire® grid polarizer technology.  The Moxtek ICE Cube™ PBS provides superior performance in broadband, low f/# spectroscopic applications where both high efficiency and excellent contrast are required. Download the PDF


ParticleFinder: Automated Particle Location and Raman Analysis
ParticleFinder:  Locate particles, generate size or shape statistics, select particles based on size or shape, and acquire Raman spectra. Easily locate and identify particulate matter, including pharmaceutical materials, trace forensic evidence, geological rock or mineral particles, and airborne contaminants trapped on filters.
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Quality of Single Layer Graphene
Demonstrates uRaman from TechnoSpex Pte. Ltd. is a promising instrument to determine the quality of the transferred single layered graphene on a 300-nm silicon dioxide (SiO2) substrate.
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Raman Analysis of Embedded Contaminants
Raman confocal spectroscopy is increasingly being applied for the analysis of embedded contaminants within materials. A noncontact, nondestructive analysis method, Raman spectroscopy requires very little sample preparation, has greater spatial resolution compared to FT-IR microscopy, and the confocal analysis method allows visualization of materials within a clear sample matrix.  This paper will investigate the analysis of an embedded contaminant within a polymer matrix on a glass substrate.
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Characterizing Polymer Laminates Using IR Microscopy
Multilayer polymer films, or laminates, are used in a wide variety of industries. Infrared microscopy is an important technique for characterizing multilayer polymer films and complex materials.
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On-line Quality Control Measurements in Varying Conditions
Real-time monitoring of a production process depends on stable instrumentation. Learn more about the importance of spectrometer’s thermal stability on process line transmission measurements at different temperatures.
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