Spectroscopy App Note:
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September 2015  
Raman Spectroscopy Applied to the Lithium-Ion Battery Analysis
The application note explains how Raman spectroscopy can be helpful in the analysis of cathodes and anodes in Li-ion batteries.
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Statistical, Morphological, and Chemical Particle Characterization of Cellulose Nitrate Filters for QC
Statistical and morphological analysis of particles on a filter has been complemented by chemical analysis based on Raman spectroscopy using the ParticleFinder tool, allowing further insight into the particle composition and its origin within a production line.
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Direct Identification of Clinically Relevant Microorganisms on Solid Culture Media by Raman Spectroscopy
Evaluation of the discrimination power of Raman spectroscopy in decreasing turnaround time in clinical diagnosis, when analyzing microcolonies from nine bacterial and one yeast species directly on solid culture medium after a shortened incubation time.
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PP-TOFMS Depth Profiling of ZnO Thin layers Co-doped with Rare Earths for Photonic Materials
Depth analysis by plasma profiling time of flight mass spectrometry of rare earth doped materials.
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Features and Benefits of Pulsed RF GD OES for the Characterization of Electrodes of Li-Ion Batteries
Pulsed RF glow discharge optical emission spectrometry provides ultra fast elemental depth profiling and is of great interest for the characterization of both positive and negative electrodes of Li-ion batteries.
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Analysis of Films on Glass by Pulsed RF GD OES
Some examples of elemental depth profiles of films on glass from published data and results illustrating the capability of the Pulsed RF GD OES instrument in this domain.
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Trace Analysis in Nd Fe B Samples for Magnetic Materials Using ICP-OES
As applications of Nd Fe B magnetic materials become more crucial, the quality of materials is more important. This application describes the analysis of trace elements in Nd Fe B matrix with evaluation of stability and accuracy.
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Characterization of Organic Light Emitting Diodes (OLED) by Spectroscopic Ellipsometry
OLED technology offers advantages to LCD technology: efficiency, high display quality, high contrast rate, lower energy consumption, and more. Ellipsometry, a nondestructive and sensitive optical technique, can provide information on performance improvements of these devices.
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An Ellipsometric Study of the Optical Constants of C60 and C70 Thin Films
Spectroscopic ellipsometry (SE) is used to determine the optical constants of C60 and C70 thin films over the range 0.6–6.5eV (that is, 190–2100nm). Information provided by the optical constants allows for better understanding of the electronic structure of these materials.
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