November 2011

November 2011

Links to technical insights from sponsored Application Notes on Spectroscopy Online.

	Composite Heat Damage Measurement Using the 4100 ExoScan FT-IR *John Seelenbinder, Agilent Technologies* The Agilent 4100 ExoScan FT-IR enables large parts to be easily, nondestructively measured to determine the amount of heat damage present.
	Expoxy Primer Thickness on Aluminum Measured with the Handheld Agilent 4100 ExoScan FT-IR *John Seelenbinder, Agilent Technologies* The handheld Agilent 4100 ExoScan FT-IR can be used to effectively measure epoxy primer thickness on aluminum.

	Identification and Evaluation of Coatings Using Hand-Held FT-IR *Shanon Richard and Pik Tang Leung, Agilent Technologies* Agilent’s hand-held portable FT-IR systems with innovative sampling technologies have taken FT-IR out of the lab and enabled its use on the production floor or wherever the sample happens to be operational.
	The Measurement of High Optical Densities (up to 8 Abs) in the Near-Infrared *Andrew R. Hind and Jan Wuelfken, Agilent Technologies* The measurement of high optical density (or absorbance) in the NIR is of significant importance to scientists and engineers in a variety of applications.
	The Determination of Film Thickness Using Diffuse Reflectance UV *Andrew R. Hind and Lisette Chomette, Agilent Technologies* The characterization of thin films is extremely important in optics and photonics applications. The parameters of interest include film thickness, refractive index, coating homogeneity, and reflectivity.
	Material Analysis by Infrared Mapping: A Case Study Using a Multi-Layer Paint Sample *Dr. Jonah Kirkwood, Dr. John Wilson, and Dr. Mustafa Kansiz, Agilent Technologies* Agilent's 610 Fourier transform infrared (FT-IR) microscopes are routinely used for the analysis of heterogeneous materials.
	Low Reflectance Measurements Using the "VW" Technique *Andrew R. Hind and Caroline Perier, Agilent Technologies* Thin film anti-reflection (AR) coatings are designed to greatly reduce the light loss through the utilization of phase changes and the dependence of reflectivity on index of refraction.

	Solutions for Polymers and Materials *Agilent Technologies* From kinetics studies, to automating QA and QC SOPs, to the study of polymer interfaces, surface modification and functionalization, and the investigation of thermal effects, Agilent offers a suite of application solutions.
	Quantitative Analysis of Copolymers Using the Cary 630 FT-IR *Frank Higgins and Alan Rein, Agilent Technologies* FT-IR spectroscopy is used to determine the amount of styrene content in styrene butadiene rubber (SBR) and the ratio of polyethylene to vinyl acetate in polyethylene vinyl acetate (PEVA) polymer.

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- Meg Evans

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