Get one powerful tool for all your needs. HORIBA's leading Raman technology is integrated with outstanding scanning probe microscopy (SPM) into one versatile instrument for fast, simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS).
HORIBA's reliable and full-featured AFM-Raman solution combines high performance and speed with ease of use. SPM techniques like AFM, STM, shear force, etc. provides topographic, mechanical, thermal, electrical, and magnetic properties with molecular resolution. Confocal Raman spectroscopy and imaging provides specific chemical information about your nano-materials, with sub-micron spatial resolution.
By combining SPM and Raman capabilities with our commercial TERS probes, it offers a unique platform for co-localized AFM-Raman and TERS imaging with nanoscale spatial resolution.
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