CHROMacademy Essential Guide Webcast

Troubleshooting GC Separations

LIVE WEBCAST:
Thursday 14th June 2012, 11:00 AM EDT; 16:00 GMT

Register free at http://www.chromatographyonline.com/gcsep

The Essential Guide from LCGC’s CHROMacademy presents the third in our series of webcasts on Practical GC Troubleshooting.  In this session, Dr. John Hinshaw (Senior Scientist , BPL Global Ltd) and Tony Taylor (Technical Director, Crawford Scientific), present practical troubleshooting tips for GC separations, with special emphasis on retention time variability, loss of efficiency and poor peak shape.  The session includes a wealth of practical information on GC separation issues and all our real world problems are related to both separation chemistry and hardware issues.   We consider the common problems and highlight causes and remedial actions in a very practically relevant way.  A must see for everyone working with GC instruments.

Troubleshooting GC Separations – retention time,
efficiency and peak shape issues
Investigate causes of retention time variability in GC including carrier and injection issues GC Instrument Troubleshooting – GC Columns and Detectors
Investigate tailing, fronting and shouldering peak behaviors – identify the major causes and learn practical remedies for the problem
Learn about loss of efficiency in capillary GC and identify the major causes, including injection and column related issues
Learn how to quickly identify problems and investigate the root cause
Build up a portfolio of preventative and corrective maintenance operations
KEY LEARNING OBJECTIVES

WHO SHOULD ATTEND

Anyone who uses GC equipment and who wants to improve their troubleshooting and instrument maintenance skills

 
Learn how to quickly identify separation problems in GC
Identify strategies to confirm the problem and investigate the causes
Investigate the major causes of retention time variability and how to fix / prevent these issues including problems with carrier gas flow rate reproducibility and injection acquisition parameter issues
Highlight major causes of peak shape deformation, including the problems associated with peak tailing caused by activity within the GC system and how to take preventative measures to minimize tailing and maximize sensitivity and area reproducibility
Highlight major causes of peak shape deformation, including the problems associated with peak tailing caused by activity within the GC system and how to take preventative measures to minimize tailing and maximize sensitivity and area reproducibility
Develop curative and preventative maintenance operations to optimize the quality of your GC data
 
Sponsored by Agilent Technologies
Speakers
Tony Taylor
Tony Taylor
Technical Director
Crawford Scientific
John V Hinshaw
John V Hinshaw
Senior Scientist
BPL Global Ltd
Janet Kelsey
Janet Kelsey
Editor
The Column
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