Live Webcast Monday, October 22, 2018 at 11am EDT | 8am PDT | 4pm BST | 5pm CEST Register now Event Overview Direct mass spectrometry (DMS) utilizing soft chemical ionization provides continuous sample analysis with high sensitivity and selectivity. Selected ion flow tube mass spectrometry (SIFT-MS), in particular, is unique among DMS techniques in that it provides rapid switching of the chemical ionization agents. SIFT-MS provides class-leading selectivity coupled with comprehensive detection of volatile organic compounds and inorganic gases. This webcast is the first in a three-part series on enhanced environmental monitoring using SIFT-MS. Here, we focus on continuous monitoring applications for industry using a variety of case studies, including: Fenceline monitoring Real-time stack gas analysis Odor characterization at the source Continuous odor monitoring Key Learning Objectives Learn the fundamentals of the SIFT-MS analytical technique, with particular focus on the unique chemical ionization that enables comprehensive, yet selective, direct gas analysis Understand how SIFT-MS enhances continuous monitoring of pollutants — from the stack to the fenceline Through case studies, discover how SIFT-MS can provide objective odor analysis Presenters Vaughan Langford, PhD Principal Scientist Syft Technologies, New Zealand Moderator Lewis Botcherby Associate Editor LCGC Europe Register now Don't miss the entire Enhanced Environmental Monitoring series: Part 1: Six Fenceline and Odor Applications of Direct MS Monday, October 22, 2018 |  On-Demand after air date Part 2: Five High-Throughput Lab Applications of Direct MS Wednesday, November 7, 2018  |  On-Demand after air date Part 3: Direct MS for Demanding Air Quality Applications Monday, November 19, 2018  |  On-Demand after air date Click Here to Register for the Whole Series Sponsored by: All attendees receive a free executive summary of the webcast. Unable to attend? All registrants receive a link to a recorded version of the webcast.