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November 19, 2019  
Spectroscopy Spotlight
New Approaches to XRD Profile Modeling
X-ray diffraction (XRD) techniques are often used to understand the nature of stacking of layers that form clay nanocrystals. But there are problems with these techniques that make applications difficult and often ambiguous. Dr. David Bish, Professor Emeritus at Indiana University (Bloomington, Indiana), and former students Dr. Hongji Yuan and Dr. Alberto Leonardi, have been exploring ways to streamline and accelerate the process with a new matrix methodology as well as gaining more accurate results through the use of simulated profiles based on very large-scale atomistic models. We spoke to Dr. Bish about his group’s work in these areas and what these improvements can mean for the future of XRD modeling
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SPIE Optics + Photonics 2020 Call for Papers. Abstracts due 12 February.
The largest multidisciplinary optical sciences meeting in North America. Plan to participate in the conference that furthers research applied to optics and photonics innovations across four sub-symposia: Nanoscience + Engineering, Organic Photonics + Electronics, Optical Engineering, and (NEW) High Speed Imaging + Diagnostics. August 23-27, 2020, San Diego, California, USA #SPIEOpticsPhotonics
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Method Development with ICP-MS/MS: Tools and Techniques to Ensure Accurate Results in Reaction Mode
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Advances in the Applications of Lasers for Bioimaging: Light Sheet Microscopy
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Analysis of FDA Infrared 483 Citations: Have You a Data Integrity Problem?
Analysis of FDA Form 483 observations and warning letters for infrared spectrometers reveals a range of data integrity problems and a lack of laboratory procedures for the technique. Is your laboratory in the same situation?
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Featured News
Melissa Fernandez and Jessica Hellinger Presented with SAS Undergraduate Award at SciX
The Society for Applied Spectroscopy (SAS) presented students Melissa Fernandez and Jessica Hellinger with the SAS Undergraduate Student Award on at SciX 2019 in Palm Springs, California.
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SAS Atomic Technical Section Student Award Presented at SciX 2019
Four student researchers were presented with the Society for Applied Spectroscopy’s (SAS) Atomic Technical Section Student Award at SciX 2019.
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